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For academic purposes these files are available under an Open Source Hardware license. By downloading, using and/or viewing these designs, documentation and related data and information, and all content in the foregoing (collectively, the “Designs”), you agree to the following: https://www.janelia.org/open-science/hardware-licensing.

Please note that we do not have the bandwidth to support you in navigating this material. 

Please also note that the commercial use has been licensed. Full lens sets will be commercially available from Thorlabs (Jeff Brooker jbrooker@thorlabs.com).

 

Note: Use these files as you like. However, we do not have the bandwidth to provide support. 

ZAR files are ZEMAX archive files and ZPL files are ZEMAX macro files.  ZEMAX 13 Release 2 SP6 was used, although all files should open more-or-less fine in latest Zemax OpticStudio release.

Full excitation design, not fully updated to current design state (slight differences), full tolerance data in tolerance data editor, no merit function.

Most updated full excitation design (used for exporting STEP file for Inventor design), no tolerance data, RMS OPD-only merit function.

Full excitation design, not fully updated (slight differences), merit function for design of PR1&2

Excitation system without pupil relays 1 & 2 (this is how most excitation design occurred), not fully updated, merit function for main excitation system design.

Evaluation of nominal performance of design w/o PR1&2.

Macros used to create plots in LFS_NSRF_Full_48_performance_rev2.pdf

Macros that will create evaluation plots for "FullFull" designs (these contain PR1&2)

Macro for calculating GDD and PTD, to be used as ZPLM operand.  Some explanation of calculations is contained in PropagationTimeMath.pdf

Output plots of FullFull_Eval_macros for excitation designs containing PR1&2

Detection system, fully updated, with objective and many different sources for evaluation

Detection system, w/o objective (using saved rayset which was generated using the objective), has merit function used for optimization

CODE V tolerance definition and evaluation performed by Julie Bentley

Accessory optics

Scanning 1p photostimulation system.

Widefield imaging system.

Epi illumination system for widefield imaging.

Coverglass angle measurement system.
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